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Surface Science & Materials Analysis
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SIMS Workstation, SIMS Analysers, Ion Guns and TPD Workstation

 

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1 EQS, a Secondary Ion Mass Spectrometer bolt on SIMS Analyser.
2 SIMS Workstation , a UHV Surface Analysis System, for thin film depth profiling.
3 Secondary ion mass spectrometer for UHV surface analysis and SNMS. The Hiden MAXIM.
4 IDP Mass Spectrometer for analysis of ions, neutrals and radicals in UHV desorption studies.
5 TPD Workstation for UHV Thermal Desorption Studies
6 Ion-FAB Guns
7 IG20 5 KeV Argon or Oxygen ion source for UHV surface analysis applications.
8 IG5C 5KeV Caesium Ion Source for UHV Surface Analysis applications.
9 IFG200 Fast Atom Bombardment Ion Gun